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+1 408 435 2777
  • Standard 3D Inspection Systems
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  • Polaris
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  • Modular Quality Control Solutions
  • AOP Custom
  • AOP Thickness
  • SEMI BGA
  • Automated In-line Manufacturing Solutions
  • SIMP - Wafer Inspection
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  • OMT - Smartphone Fitting
  • Support & Services
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AOP Thickness Dual sensor thickness measurement platform

A State-of-the-art DUAL SENSOR thickness platform for PRECISE and ACCURATE thickness measurement

Solarius has developed a thickness measurement platform that uses two precision-aligned non-contact sensors. This measurement approach is extremely fast and accurate and allows measuring the thickness of one or more layers on an object from both sides. For the dual-sensor thickness measurement, each side of the part is measured simultaneously, and the difference of measurements from the two sensors provides the final thickness measurement.

  • Fast and accurate thickness measurement
  • Modular design
  • High throughput by a large measurement area
  • Flexible and easy to automate
  • Customized user interface
  • Customized analysis
  • Non-contact and non-destructive

The AOP-Thickness platform is equipped with a NanoPrecision XY stage with a measurement area up to 400 mm x 400 mm. Two high speed line or point sensors enable height measuring ranges between 2 mm and 145 mm with vertical resolutions of 0.2 µm up to 5 µm. Solarius SolarScan software provides automation features as well as customized recipes. The modular system design offers the highest flexibility for customized analysis tools.

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Typical Applications

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Consumer Electronic

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Automotive Industry

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Fuel Cells & Components

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Printing & Paper

Are you interested

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Headquarters USA

Bering Drive 2390
95131 San Jose

  • +1 408 435 2777
  • sales@solarius-inc.com
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