Solarius Development announces introduction of a new optical profiler
Sunnyvale, CA., June 2, 2004 - Solarius Development, Inc. has introduced a new non-contact optical imaging profiler using proprietary technology. The Sensofar has a dual technology sensor head combining confocal and interferometry techniques (PSI and VSI), which can measure steep slopes, rough and low reflective surfaces and samples containing dissimilar materials. The optical imaging profiler is a complete tool that is designed to obtain a fast, non-invasive assessment of the micro and nano-geometry of technical surfaces. It can be used on multiple configurations from the stand set-up for R&D, and quality inspection laboratories to the manipulator or robot-driven system for on-line process controls. An integrated system controller is used for image processing and sensor positioning control. The ergonomic software interface lets the user obtain a requested measurement by choosing the right objective and focusing and selecting the appropriate acquisition technique.
About Solarius Development
Solarius Development, Inc., headquartered in Sunnyvale, CA develops and manufactures a broad range of non-contact 3D laser and optical measurement systems for a wide range of applications.
Public Relations Coordinator
(408) 541-0151