Autofocus Measurement
The principle
In the autofocus principle condensed light
is focused from a laser diode onto the specimen surface. The reflected light
is directed to a focus detector, which measures deviations from the ideal
focus to within a few nanometers. The deviation in focus generates an error,
which is used to re-focus the objective. The position of the objective represents
an absolute measurement of the height.
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Measurement principle of the autofocus control circuit
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| A precise digital position measurement system enables high resolution down to 25 nm |
The advantages
The autofocus sensor is remarkable for its high vertical resolution.
With a measurement range of 1.5 mm it resolves down to 20 nm. It is therefore
capable of fast form and roughness measurement simultaneously.
Because of its high dynamics the AF2000 sensor performs best on surfaces with varying reflection coefficients.
Specifications
| Sensor | Camera | ||
| Spot size [µm] | 1,5 | Integrated in-axis camera | |
| Vertical resolution [µm] | 0,020 | Field of view [mm] | 0,6x0,8 |
| Measurement frequency [Hz] | 10,000 | ||
| Stand off [mm] | 2 or 5 | Laser diode | Class I |
| Linearity [%] | <0,08 | Wavelength [nm] | 630 |
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| The AF2000 sensor |














